1215FCB·FGB
High-Sensitivity Dynamic
Detector Optimized AXI
Detector Optimized AXI
- X-ray inspection of all visible and hidden solder joints
- New detector option for high resolution X-ray inspection of electronic assemblies
- Flexible use for 2D and 3D inspection
High Class Image Quality for AXI
High Resolution Type
- Superior Pixel Resolution new detectors more competent to semiconductors and tiny electronics components inspection
- Advanced evaluation without overlaying features in the X-ray image
High Speed Type
- More than 2X faster than conventional
- Stay the sensitivity without data loss even at high speed
Premium Solution Type
- Premium Dynamic Detector of High-resolution, High-Speed, High-Sensitivity, High-Energy
- High-resolution even at a high output : up to 320kVp
Excellent High-Resolution
by CMOS Technology
by CMOS Technology
- Standard models in a range of pixel and detector sizes
- Robust mechanical design
Application
Specification
| Sensor Type | CMOS |
|---|---|
| Scintillator | CsI / GOS |
| Total Pixel Matrix (Pixels) | 2352 x 2944 (@1x1) |
| Active Area (mm) | 116.4 x 145.7 |
| Pixel Pitch (㎛) | 49.5 (@1x1) |
| Frame Rate (fps) | 8 /10 (@1x1) |
| Energy Range (kVp) | 40 - 160 (Normal) |
|---|---|
| Power Consumption | 24 V / 3.54 A |
| A/D Conversion (bits) | 14 |
| Data Interface | GigE / C-link |
| Dimension (mm) | 240.2 x 160.0 x 33.1 |
| Weight (kg) | 2.7 |
- Product design and specifications are subject to change without prior notice to improve product performance.
- Downloads are only supported for customers who have filled out information.
- The image quality level may vary depending on the product usage environment.