documentItem Object
(
[document_srl] => 40789
[lang_code] => ko
[grant_cache] =>
[allow_trackback_status] =>
[columnList] => Array
(
)
[allowscriptaccessList] => Array
(
)
[allowscriptaccessKey] => 0
[uploadedFiles] => Array
(
)
[error] => 0
[message] => success
[variables] => Array
(
[title] => 0505A
[nick_name] => admin
[regdate] => 20201030002233
[readed_count] => 457
[is_notice] => N
[document_srl] => 40789
[module_srl] => 40663
[category_srl] => 40665
[lang_code] => ko
[member_srl] => 4
[last_update] => 20221123081529
[comment_count] => 0
[trackback_count] => 0
[uploaded_count] => 12
[status] => PUBLIC
[title_bold] => N
[title_color] => N
[content] =>
CMOS Technology Advantage
<
- Choice of various scintillator
- Provide resolution requirements based on work condition
- Provide optimized Sensitivity
- Radiation hard pixel design with adjustable saturation dose levels
- Suitable for all industrial applications
- Clear image with high-resolution and low noise performance
More precise details even
at Smallest components
- More precise NDT inspections for even the smallest components
- Industrial X-ray is ideal for
- Solder inspection, Electronics inspection, Battery inspection Ball Grid Array inspection, Through Hole Technology inspection
Excellent High-Resolution
by CMOS Technology
- Standard models in a range of pixel and detector sizes
- Robust mechanical design
)
[httpStatusCode] =>
)
1
documentItem Object
(
[document_srl] => 40747
[lang_code] => ko
[grant_cache] =>
[allow_trackback_status] =>
[columnList] => Array
(
)
[allowscriptaccessList] => Array
(
)
[allowscriptaccessKey] => 0
[uploadedFiles] => Array
(
)
[error] => 0
[message] => success
[variables] => Array
(
[title] => 0712FCA·FGA
[nick_name] => admin
[regdate] => 20201030004332
[readed_count] => 277
[is_notice] => N
[document_srl] => 40747
[module_srl] => 40663
[category_srl] => 40665
[lang_code] => ko
[member_srl] => 4
[last_update] => 20221123081537
[comment_count] => 0
[trackback_count] => 0
[uploaded_count] => 7
[status] => PUBLIC
[title_bold] => N
[title_color] => N
)
[httpStatusCode] =>
)
1
documentItem Object
(
[document_srl] => 40770
[lang_code] => ko
[grant_cache] =>
[allow_trackback_status] =>
[columnList] => Array
(
)
[allowscriptaccessList] => Array
(
)
[allowscriptaccessKey] => 0
[uploadedFiles] => Array
(
)
[error] => 0
[message] => success
[variables] => Array
(
[title] => 1215A
[nick_name] => admin
[regdate] => 20201030005013
[readed_count] => 1046
[is_notice] => N
[document_srl] => 40770
[module_srl] => 40663
[category_srl] => 40665
[lang_code] => ko
[member_srl] => 4
[last_update] => 20221123081544
[comment_count] => 0
[trackback_count] => 0
[uploaded_count] => 12
[status] => PUBLIC
[title_bold] => N
[title_color] => N
)
[httpStatusCode] =>
)
1
documentItem Object
(
[document_srl] => 45127
[lang_code] => ko
[grant_cache] =>
[allow_trackback_status] =>
[columnList] => Array
(
)
[allowscriptaccessList] => Array
(
)
[allowscriptaccessKey] => 0
[uploadedFiles] => Array
(
)
[error] => 0
[message] => success
[variables] => Array
(
[title] => 1215MGF
[nick_name] => admin
[regdate] => 20201030005013
[readed_count] => 712
[is_notice] => N
[document_srl] => 45127
[module_srl] => 40663
[category_srl] => 40665
[lang_code] => ko
[member_srl] => 4
[last_update] => 20221123081554
[comment_count] => 0
[trackback_count] => 0
[uploaded_count] => 11
[status] => PUBLIC
[title_bold] => N
[title_color] => N
[content] =>
CMOS Technology Advantage
- Choice of various scintillator
- Provide resolution requirements based on work condition
- Provide optimized Sensitivity
- Radiation hard pixel design with adjustable saturation dose levels
- Suitable for all industrial applications
- Clear image with high-resolution and low noise performance
More precise details even
at Smallest components
- More precise NDT inspections for even the smallest components
- Industrial X-ray is ideal for
- Solder inspection, Electronics inspection, Battery inspection Ball Grid Array inspection, Through Hole Technology inspection
Excellent High-Resolution
by CMOS Technology
- Standard models in a range of pixel and detector sizes
- Robust mechanical design
)
[httpStatusCode] =>
)
1
documentItem Object
(
[document_srl] => 40754
[lang_code] => ko
[grant_cache] =>
[allow_trackback_status] =>
[columnList] => Array
(
)
[allowscriptaccessList] => Array
(
)
[allowscriptaccessKey] => 0
[uploadedFiles] => Array
(
)
[error] => 0
[message] => success
[variables] => Array
(
[title] => 1215FCB·FGB
[nick_name] => admin
[regdate] => 20201030004709
[readed_count] => 877
[is_notice] => N
[document_srl] => 40754
[module_srl] => 40663
[category_srl] => 40665
[lang_code] => ko
[member_srl] => 4
[last_update] => 20240216092129
[comment_count] => 0
[trackback_count] => 0
[uploaded_count] => 3
[status] => PUBLIC
[title_bold] => N
[title_color] => N
[content] =>
High-Sensitivity Dynamic
Detector Optimized AXI
- X-ray inspection of all visible and hidden solder joints
- New detector option for high resolution X-ray inspection of electronic assemblies
- Flexible use for 2D and 3D inspection
Excellent High-Resolution
by CMOS Technology
- Standard models in a range of pixel and detector sizes
- Robust mechanical design
)
[httpStatusCode] =>
)
1
documentItem Object
(
[document_srl] => 47023
[lang_code] => en
[grant_cache] =>
[allow_trackback_status] =>
[columnList] => Array
(
)
[allowscriptaccessList] => Array
(
)
[allowscriptaccessKey] => 0
[uploadedFiles] => Array
(
)
[error] => 0
[message] => success
[variables] => Array
(
[title] => MIDAS 2121
[nick_name] => admin
[regdate] => undefined
[readed_count] => 2233
[is_notice] => N
[document_srl] => 47023
[module_srl] => 40663
[category_srl] => 40665
[lang_code] => en
[member_srl] => 4
[last_update] => 20240229115135
[comment_count] => 0
[trackback_count] => 0
[uploaded_count] => 5
[status] => PUBLIC
[title_bold] => N
[title_color] => N
)
[httpStatusCode] =>
)
1